US Patent Issued to Hover on Feb. 24 for "Trained machine learning model for estimating structure feature measurements" (California Inventors)

ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,561,900, issued on Feb. 24, was assigned to Hover Inc. (San Francisco).

"Trained machine learning model for estimating structure feature measurements" was invented by Ajay Mishra (Palo Alto, Calif.), William Castillo (San Carlos, Calif.), A.J. Altman (San Francisco) and Manish Upendran (San Francisco).

According to the abstract* released by the U.S. Patent & Trademark Office: "A computer system trains a machine learning model to estimate a real-world measurement of a feature of a structure. The machine learning model is trained using a plurality of digital image sets, wherein each image set depicts a particular structure, and a plurality of measurements, wherein each measurement is a...