US Patent Issued to HORIBA Advanced Techno on Sept. 15 for "Measurement instrument, measurement device, measurement system, and measurement method" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,462, issued on Sept. 15, was assigned to HORIBA Advanced Techno Co. Ltd. (Kyoto, Japan).

"Measurement instrument, measurement device, measurement system, and measurement method" was invented by Keisuke Sasai (Kyoto, Japan), Issei Kobayashi (Kyoto, Japan), Kazuhiro Irie (Kyoto, Japan) and Wataru Kinoshita (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement instrument comprises a cylindrical cell that stores a measurement fluid, a drive mechanism that rotates the cell about a central axis, a first light source that is arranged outside the cell and irradiates the measurement fluid with first inspection light, a second light sour...