US Patent Issued to HON HAI PRECISION INDUSTRY on May 12 for "Method for detecting defect in image and device for detecting defect in image" (Taiwanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,626,501, issued on May 12, was assigned to HON HAI PRECISION INDUSTRY Co. LTD. (New Taipei, Taiwan).

"Method for detecting defect in image and device for detecting defect in image" was invented by Li-Che Lin (Kaohsiung, Taiwan), Yen-Yi Lin (New Taipei, Taiwan) and Cheng-Feng Wang (Kaohsiung, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for detecting defect in image is provided. The method obtains a number of original images, determines a first reference image from the original images, and performs a histogram matching on the original images excluding the first reference image according to the first reference image, to obtain a plurality...