US Patent Issued to HKC on Sept. 8 for "Halo test method and halo test device" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,731,518, issued on Sept. 8, was assigned to HKC CORPORATION LIMITED (Shenzhen, China).

"Halo test method and halo test device" was invented by Yang He (Shenzhen, China) and Junfeng Xie (Shenzhen, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A halo test method includes selecting one or more to-be-tested regions from a to-be-tested display device; and lighting up a target test region with a preset grey scale; and then obtaining luminances where a plurality of unlit pixel points within a preset range from the target test region are located, and obtaining the normalized grey scales corresponding to the luminances where each unlit pixel point is loca...