US Patent Issued to HITACHI SOLUTIONS on Aug. 25 for "AI quality monitoring system" (Japanese Inventor)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,718,150, issued on Aug. 25, was assigned to HITACHI SOLUTIONS LTD. (Tokyo).

"AI quality monitoring system" was invented by Hidekazu Ito (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "The objective of the present disclosure is to provide a technique capable of efficiently monitoring quality of learning model without depending on input data. An AI quality monitoring system according to the present disclosure acquires an inferred result acquirable from a compared model inferring with respect to input data of same type as learning data learned by a learning model, and then compares the inferred result acquired from the compared model with correct ans...