ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,238, issued on Oct. 20, was assigned to Hitachi Ltd. (Tokyo).

"Automatic screen operation test support apparatus and automatic screen operation test support method" was invented by Erika Narata (Tokyo), Naoki Utsunomiya (Tokyo), Shingo Katano (Tokyo) and Keisuke Fukumoto (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are an automatic screen operation test support apparatus and an automatic screen operation test support method capable of extracting a problematic defect difference in an automatic screen operation test of a screen system without requiring manual work. The automatic screen operation test support apparatus executes non-de...