US Patent Issued to Hitachi on July 14 for "Failure probability evaluation device and failure probability evaluation method" (Japanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,788, issued on July 14, was assigned to Hitachi Ltd. (Tokyo).

"Failure probability evaluation device and failure probability evaluation method" was invented by Hiroshi Shintani (Tokyo) and Hisashi Tanie (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A failure probability evaluation device for a mechanical system includes one or more memory devices having a program stored thereon. When executed by one or more processors, the program causes the one or more processors to store a failure model that computes the failure probability of the mechanical system, and an occurrence frequency distribution of a probability variable. The one or more process...