ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,560,914, issued on Feb. 24, was assigned to HITACHI LTD. (Tokyo).
"Automatic inspection system and wireless slave device" was invented by Reiso Sasaki (Tokyo) and Kazuo Ono (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "An automatic inspection system includes a wireless slave device and a wireless master device. The wireless slave device includes a sound collection unit that collects sound generated from an inspection target object, an analysis unit that analyzes the collected sound to obtain a degree of difference between the collected sound and normal sound learned in advance and sound state information of the collected sound, as an analysis re...