US Patent Issued to HITACHI on Aug. 18 for "Sample holder, electron microscope system and sample observation method" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,712,146, issued on Aug. 18, was assigned to HITACHI LTD. (Tokyo).

"Sample holder, electron microscope system and sample observation method" was invented by Akira Sugawara (Tokyo), Fumiaki Ichihashi (Tokyo) and Toshiaki Tanigaki (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A sample holder enables easy control of a progress rate of a chemical reaction of a sample to be observed and facilitates observation of the chemical reaction. A sample holder includes a cylindrical holder outer cylinder, a sample holding section that is connected to one end of the holder outer cylinder and holds a sample, a gas reservoir tank that is connected to another end ...