ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,542, issued on April 21, was assigned to HITACHI LTD. (Tokyo).
"Defect knowledge circulation system" was invented by Takumi Kato (Santa Clara, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method for performing defect summarization, the method comprising: receiving, by a processor, defect records associated with an operation; receiving, by the processor, work information associated with the operation linking, by the processor, the defect records and the work information using a first Artificial Intelligence (AI) model to generate linked information; and performing, by the processor, summary generation using a second AI model to generate w...