ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,986, issued on April 21, was assigned to Hitachi Ltd. (Tokyo).
"Abnormal state monitoring system and abnormal state monitoring method" was invented by Akinobu Watanabe (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "Work efficiency and quality are improved. The invention includes: a sensor information acquisition unit configured to acquire, from a sensor configured to detect a state of a worker, sensor information indicating a detection result; a work check data holding unit configured to hold in advance, as work check data, an action of the worker assumed from a work procedure; and an abnormality detection unit configured to detect an abnorm...