US Patent Issued to Hitachi High-Tech on Sept. 29 for "Charged particle gun and charged particle beam apparatus" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,749,643, issued on Sept. 29, was assigned to Hitachi High-Tech Corp. (Tokyo).

"Charged particle gun and charged particle beam apparatus" was invented by Tomoya Igari (Tokyo), Masahiro Fukuta (Tokyo) and Takashi Doi (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are a charged particle gun and a charged particle beam apparatus that can reduce instability in the amount of emitted charged particles and deviation in the charged particle trajectory when the amount of charged particle beams is increased. A charged particle gun includes a charged particle source that generates a charged particle, an electrode portion that includes an extraction...