US Patent Issued to Hitachi High-Tech on Sept. 22 for "Sample holder and analysis system" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,744,179, issued on Sept. 22, was assigned to Hitachi High-Tech Corp. (Tokyo).

"Sample holder and analysis system" was invented by Hiroyuki Asakura (Tokyo), Hideki Kikuchi (Tokyo) and Toshie Yaguchi (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A sample holder with high versatility is provided. A sample holder 100 includes a holder shaft 2, a placement unit 3 on which a sample SAM is placeable, a moving mechanism 4 that moves the holder shaft in a first direction, rotating mechanism 5 that rotates the holder shaft 2 in a first rotation direction with a center of the holder shaft 2 as a rotation axis, a protrusion unit 6 that is fixed to the hold...