US Patent Issued to Hitachi High-Tech on Oct. 6 for "Sample image observation device and method" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,755,926, issued on Oct. 6, was assigned to Hitachi High-Tech Corp. (Tokyo).

"Sample image observation device and method" was invented by Yuta Imai (Tokyo), Daisuke Bizen (Tokyo) and Junichi Katane (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "To provide a sample image observation device and a method that restore an image based on a sparsely sampled image and that can improve observation throughput and usability by maintaining a restored image quality constant regardless of a change in an observation condition. In a sample image observation device that irradiates a part of an observation area of the sample 19 with an electron beam and restores an ...