US Patent Issued to Hitachi High-Tech on Nov. 3 for "Genotype analysis device and method" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,868, issued on Nov. 3, was assigned to Hitachi High-Tech Corp. (Tokyo).

"Genotype analysis device and method" was invented by Toru Yokoyama (Tokyo), Michiru Fujioka (Tokyo) and Ayaka Okuno (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A genotype analysis device includes an electrophoresis device and a data analysis device. A mobility model management unit including an environment information receiving unit, a prediction model storage unit, and a mobility prediction unit is provided in an STR analysis unit of the data analysis device. The mobility prediction unit generates a prediction model for predicting a correction amount of a standard bas...