US Patent Issued to HITACHI HIGH-TECH on Nov. 3 for "Electron microscope" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,785,034, issued on Nov. 3, was assigned to HITACHI HIGH-TECH Corp. (Tokyo).

"Electron microscope" was invented by Katsura Takaguchi (Tokyo), Takashi Ohshima (Tokyo), Hideo Morishita (Tokyo), Yoichi Ose (Tokyo), Junichi Katane (Tokyo), Toshihide Agemura (Tokyo) and Michio Hatano (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An object of the invention is to provide an electron microscope capable of obtaining a sufficient energy resolution without forming a long drift space and capable of attaining high energy discrimination detection performance with approximately the same device size as in the related art. The electron microscope according to the ...