US Patent Issued to Hitachi High-Tech on Nov. 3 for "Charged particle beam device" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,785,033, issued on Nov. 3, was assigned to Hitachi High-Tech Corp. (Tokyo).

"Charged particle beam device" was invented by Hiroyuki Yamamoto (Tokyo), Takeshi Ohmori (Tokyo), Masaru Kurihara (Tokyo), Keiichiro Hitomi (Tokyo), Shunya Tanaka (Tokyo) and Hirofumi Sato (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An imaging device is provided with a sample stage configured to be capable of transferring a sample by at least two drive shafts, and shifting an imaging field of view corresponding to positional information of the sample, the positional information being obtained by a computer system. The computer system includes a classifier which outputs,...