US Patent Issued to Hitachi High-Tech on Nov. 3 for "Analysis system and analysis method" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,281, issued on Nov. 3, was assigned to Hitachi High-Tech Corp. (Tokyo).

"Analysis system and analysis method" was invented by Takashi Anazawa (Tokyo), Ryoji Inaba (Tokyo), Shuhei Yamamoto (Tokyo), Taro Nakazawa (Tokyo), Michiru Fujioka (Tokyo) and Motohiro Yamazaki (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "In an analysis method and an analysis system for detecting fluorescences from each of a plurality of light-emitting points in a plurality of wavelength bands in order to identify fluorescence emissions of a plurality of types of fluorophores from the plurality of light-emitting points, spatial crosstalk and spectral crosstalk are presen...