US Patent Issued to HITACHI HIGH-TECH on May 19 for "Automatic analyzer and sample aspiration method in automatic analyzer" (Japanese Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,661, issued on May 19, was assigned to HITACHI HIGH-TECH Corp. (Tokyo).

"Automatic analyzer and sample aspiration method in automatic analyzer" was invented by Yoshihiro Kabe (Tokyo), Takuya Takahashi (Tokyo), Masashi Fukaya (Tokyo) and Kenshiro Sakata (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "To provide an automatic analyzer and a sample aspiration method in an automatic analyzer capable of analyzing a sample of further minute amount compared than before. In aspirating the sample, a sample dispensing mechanism 13, 14 is controlled so as to detect the liquid level L1, to thereafter allow a dispensing probe 13a, 14a of the sample dispensin...