US Patent Issued to Hitachi High-Tech on May 12 for "Test sample reading device and test sample reading method" (Japanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,626,080, issued on May 12, was assigned to Hitachi High-Tech Corp. (Tokyo).

"Test sample reading device and test sample reading method" was invented by Kento Sekiya (Tokyo), Jiro Hashizume (Tokyo), Taiki Fuji (Tokyo) and Jaesung Yang (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "Self-luminous barcode readers 102A, 102B, 102C, 102D, 102E, 102F are provided in an arrangement such that irradiating light emitted from the barcode readers 102A, 102B, 102C, 102D, 102E, 102F entirely covers a surface provided with a barcode 107 and optical axes 104A, 104B, 104C, 104D, 104E, 104F of the irradiating light are inclined horizontally at an angle greater than ...