US Patent Issued to Hitachi High-Tech on March 24 for "Transfer device and analysis system" (Japanese Inventors)

ALEXANDRIA, Va., March 24 -- United States Patent no. 12,586,751, issued on March 24, was assigned to Hitachi High-Tech Corp. (Tokyo).

"Transfer device and analysis system" was invented by Naofumi Kobayashi (Tokyo), Kenichi Nishinaka (Tokyo) and Tsunenori Nomaguchi (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a technique capable of shortening observation throughput of a sample. A transfer device 2 includes a holder 24 configured to hold a mesh MS on which a sample to be analyzed using a charged particle beam device 3 is mounted, a position information acquisition function configured to acquire first information about a positional relationship between the mesh MS and the holder 24, and a ...