US Patent Issued to HITACHI HIGH-TECH on June 23 for "Sample conveying device and method with speed abnormality detection" (Japanese Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,431, issued on June 23, was assigned to HITACHI HIGH-TECH Corp. (Tokyo).

"Sample conveying device and method with speed abnormality detection" was invented by Saori Chida (Tokyo), Shigeru Yano (Tokyo) and Takeshi Tamakoshi (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A sample conveying device and a sample conveyance method capable of determining a cause of an abnormality in a conveyance speed more quickly than in the related art. In a conveying device, a general conveyance speed of a conveying container is obtained from a position of the conveying container detected by a position detection unit to determine whether the general conveyance sp...