US Patent Issued to HITACHI HIGH-TECH on June 2 for "Mass spectrometry device and method for controlling same" (Japanese Inventors)

ALEXANDRIA, Va., June 2 -- United States Patent no. 12,646,701, issued on June 2, was assigned to HITACHI HIGH-TECH Corp. (Tokyo).

"Mass spectrometry device and method for controlling same" was invented by Yuka Sugawara (Tokyo), Yuichiro Hashimoto (Tokyo), Hiroyuki Yasuda (Tokyo), Masuyuki Sugiyama (Tokyo) and Riku Tamura (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A mass spectrometry device can reduce a deviation in a mass axis due to the generation of heat from an AC voltage control circuit; and a method for controlling the mass spectrometry device. The mass spectrometry device has a quadrupole electrode, to which a controlled AC voltage is applied, and uses the quadrupole electrode as a mass fil...