ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,279, issued on July 7, was assigned to Hitachi High-Tech Corp. (Tokyo).
"Electron microscope" was invented by Michiko Suzuki (Tokyo) and Yudai Kubo (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "An object of the invention is to efficiently execute aberration correction in an electron microscope including an aberration corrector that corrects aberration using a multipole lens. The electron microscope according to the invention includes an aberration corrector that includes first and second multipole lenses, a transfer lens, and an adjustment lens, in which the first multipole lens is configured to correct third-order spherical aberration by adj...