US Patent Issued to HITACHI HIGH-TECH on July 21 for "Specimen inspection system, and conveyance method" (Japanese Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,556, issued on July 21, was assigned to HITACHI HIGH-TECH Corp. (Tokyo).

"Specimen inspection system, and conveyance method" was invented by Shigeru Yano (Tokyo), Shinji Azuma (Tokyo) and Takeshi Matsuka (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "In a two-dimensional conveyance line employing an electromagnetic conveyance technique, carriers are conveyed in consideration of the length of a group of stagnated carriers, so as to reduce idle positions and ensure conveyance efficiency of a specimen inspection system and maximize the number of carriers conveyed simultaneously. Current is supplied to a winding of an electromagnetic circuit and ...