US Patent Issued to Hitachi High-Tech on Aug. 4 for "Electrolyte analysis device and method for identifying abnormality in same" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,699,071, issued on Aug. 4, was assigned to Hitachi High-Tech Corp. (Tokyo).

"Electrolyte analysis device and method for identifying abnormality in same" was invented by Airi Iwasawa (Tokyo), Emiko Ushiku (Tokyo) and Miki Furuya (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are an electrolyte analysis device and a method for identifying an abnormality in the same that make it possible to detect an abnormality in an ion-selective electrode at an early stage. The electrolyte analysis device comprises an ion-selective electrode that generates a sample potential that is a potential corresponding to the ion concentration of a sample, a referen...