ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,719,011, issued on Aug. 25, was assigned to Hitachi High-Tech Corp. (Tokyo).
"Transmission electron microscope" was invented by Akinari Hanawa (Tokyo), Toshie Yaguchi (Tokyo) and Hideki Kikuchi (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "An object of the invention is to reduce influence of a phase contrast on an observation image in a transmission electron microscope and to enable image observation with high magnification and high resolution. The transmission electron microscope according to the invention can switch between a first mode in which a lens barrel is airtightly sealed between an electron beam source side and a stage side by a diaph...