US Patent Issued to Hitachi High-Tech on Aug. 25 for "Computer system, dimension measuring method, and semiconductor device manufacturing system" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,718,344, issued on Aug. 25, was assigned to Hitachi High-Tech Corp. (Tokyo).

"Computer system, dimension measuring method, and semiconductor device manufacturing system" was invented by Yutaka Okuyama (Tokyo) and Takeshi Ohmori (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A computer system for extracting, from image data, coordinate information on base points for measuring a dimension of a desired portion of a pattern, and measuring the dimension by using the coordinate information, the computer system including a preprocessing unit configured to allow training by matching all of the samples by setting a base point insufficient in annotation da...