US Patent Issued to HITACHI HIGH-TECH on Aug. 25 for "Automatic analysis device" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,907, issued on Aug. 25, was assigned to HITACHI HIGH-TECH Corp. (Tokyo).

"Automatic analysis device" was invented by Miki Furuya (Tokyo), Emiko Ushiku (Tokyo) and Masahiko Iijima (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An ISE measurement unit that measures the electrolyte concentration of a sample, a spectrophotometer that measures biochemical parameters of a sample, a pH measurement mechanism that measures the pH of a sample,sample dispensing mechanisms that dispense the sample for measurement in the ISE measurement unit or the spectrophotometer from a container that contains the sample; and a conveyance mechanism that conveys the con...