ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,711, issued on April 14, was assigned to HITACHI HIGH-TECH Corp. (Tokyo).
"Automated analysis apparatus" was invented by Masafumi Miyake (Tokyo), Takushi Miyakawa (Tokyo) and Tetsuji Kawahara (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "The purpose of the present invention is to provide an automated analysis apparatus that can reduce the influence of a pre-sample more reliably, by delivering an internal standard solution. The automated analyzing apparatus according to the present invention determines in advance whether the ion concentration of a first sample is higher than the ion concentration of a second sample by a reference value, and ...