US Patent Issued to HITACHI HIGH-TECH ANALYSIS on Sept. 1 for "Sample piece relocating device" (Japanese Inventor)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,725,755, issued on Sept. 1, was assigned to HITACHI HIGH-TECH ANALYSIS Corp. (Tokyo).

"Sample piece relocating device" was invented by Tatsuya Asahata (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "This sample piece relocating device (10) includes an optical interferometry device (11), a sample piece carrying device (13), and a control device (21). The control device (21) controls the sample piece carrying device (13) based on information relating to processing in which a charged-particle beam device is used to irradiate a sample (S) with a charged-particle beam, thereby preparing a sample piece. The sample piece carrying device (13) controlled b...