ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,574, issued on May 19, was assigned to HITACHI HIGH-TECH ANALYSIS Corp. (Tokyo).
"X-ray transmission inspection apparatus and X-ray transmission inspection method" was invented by Satoshi Matsubara (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "Proposed are an X-ray transmission inspection apparatus and an X-ray transmission inspection method, in which transmission images with a large difference between irradiation angles are obtained so that the depth of the position of a foreign object can be obtained with high precision. The apparatus includes an X-ray source, an X-ray sensor configured to detect a transmitted X-ray, a sample moving mechani...