US Patent Issued to HITACHI ASTEMO on Sept. 8 for "Sensor abnormality detection device" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,728,688, issued on Sept. 8, was assigned to HITACHI ASTEMO LTD. (Ibaraki, Japan).

"Sensor abnormality detection device" was invented by Ryusuke Hirao (Ibaraki, Japan), Masatoshi Yamahata (Ibaraki, Japan) and Shu Kato (Ibaraki, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A CAN input unit (traveling speed input unit) to which a traveling speed of a vehicle is to be input and sprung acceleration input units (a first sensor input unit and a second sensor input unit) to which signal fluctuation ranges (vibration levels) of sprung acceleration sensors are to be input are included. An ECU includes a first determination unit which determines whether a ...