US Patent Issued to HITACHI ASTEMO on Sept. 15 for "Visual inspection apparatus, visual inspection method, image generation apparatus, and image generation method" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,737,874, issued on Sept. 15, was assigned to HITACHI ASTEMO LTD. (Ibaraki, Japan).

"Visual inspection apparatus, visual inspection method, image generation apparatus, and image generation method" was invented by Hideaki Onozuka (Hitachinaka, Japan), Takateru Seki (Hitachinaka, Japan), Takamasa Imaizumi (Hitachinaka, Japan) and Hiroyuki Hayashi (Hitachinaka, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A visual inspection apparatus is configured to inspect a surface of a piston based on a captured image acquired by a camera and a learning result acquired by conducting machine learning using a plurality of defective product sample images, each of...