US Patent Issued to HITACHI ASTEMO on June 16 for "Visual inspection device, visual inspection method, image generation device, and image generation method" (Japanese Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,657,692, issued on June 16, was assigned to HITACHI ASTEMO LTD. (Hitachinaka, Japan).

"Visual inspection device, visual inspection method, image generation device, and image generation method" was invented by Hideaki Onozuka (Hitachinaka, Japan), Shinichi Inoue (Hitachinaka, Japan), Takamasa Imaizumi (Hitachinaka, Japan) and Hiroyuki Hayashi (Hitachinaka, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a visual inspection device including: an image pickup unit configured to pick up an image of a surface of an object to be inspected; a posture control unit configured to change a posture of the object to be inspected with respect to the i...