ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,571, issued on April 21, was assigned to HITACHI ASTEMO LTD. (Ibaraki, Japan).
"Visual inspection apparatus and visual inspection method" was invented by Takahiro Fujioka (Hitachinaka, Japan), Hiroki Morii (Hitachinaka, Japan), Takamasa Imaizumi (Hitachinaka, Japan) and Hiroyuki Hayashi (Hitachinaka, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A visual inspection apparatus of the present invention includes a rotational portion configured to rotate in a state that an inspection target is placed on the rotational portion, a mirror portion provided so as to reflect the inspection target in the state that the inspection target is placed on the...