US Patent Issued to HIOKI E.E. on June 30 for "Measuring device, measuring system, and measuring method" (Japanese Inventor)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,460, issued on June 30, was assigned to HIOKI E.E. Corp. (Nagano, Japan).

"Measuring device, measuring system, and measuring method" was invented by Hideyuki Nagai (Nagano, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measuring device measures a state of a plurality of weld zones formed when a weldment is welded to a workpiece at a plurality of locations. This measuring device includes a plurality of application circuits that apply a current to each of one or more weld zones exclusively selected among the plurality of weld zones, and a detection circuit that detects a voltage obtained by combining voltages indicating magnitudes of voltage ...