US Patent Issued to HIOKI E.E. on July 28 for "Measurement apparatus and measurement method" (Japanese Inventors)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,328, issued on July 28, was assigned to HIOKI E.E. Corp. (Nagano, Japan).

"Measurement apparatus and measurement method" was invented by Kazuaki Haneda (Nagano, Japan) and Tomohiro Yokoyama (Nagano, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "There is realized a measurement apparatus capable of highly accurate synchronous detection while keeping costs low. A measurement apparatus is characterized by including: a current generation circuit causing an alternating constant current corresponding to a reference signal (Ss) with a predetermined frequency to occur and supplying the alternating constant current to a measurement target object; a vol...