ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,698,961, issued on Aug. 4, was assigned to HEXAGON INNOVATION HUB GMBH (Heerbrugg, Switzerland).
"Arrangement for optical measurements and related method" was invented by Petri Lehtonen (Tampere, Finland) and Lukas Scheer (Tampere, Finland).
According to the abstract* released by the U.S. Patent & Trademark Office: "An arrangement for optically measuring the surface, such as surface shape and/or associated surface defects, of an optionally glossy target object, comprising: a diffusive, semi-transparent illumination structure defining a hollow, preferably curved, elongated surface shape, constituting a tunnel shape, configured to surround at least one target object at least partially, ...