US Patent Issued to Hewlett Packard Enterprise Development on Aug. 25 for "Automatic data quality monitoring using machine learning" (Puerto Rico, California Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,718,142, issued on Aug. 25, was assigned to Hewlett Packard Enterprise Development LP (Spring, Texas).

"Automatic data quality monitoring using machine learning" was invented by Wilfredo E. Lugo (Aguadilla, Puerto Rico) and Robert Mccarthy (Granite Bay, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods are provided for measuring data set quality by applying Machine Learning (ML) to the data set, identifying good/bad records therein, and further identifying or scoring the records and data sets reflecting whether or not they are good or bad. Knowledge of the goodness or badness of the records of the data sets may enable a user to m...