US Patent Issued to Hewlett Packard Enterprise Development on April 14 for "Testing transceiver ports of a network device with on-chip time domain reflectometry diagnostic tests" (California Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,603,826, issued on April 14, was assigned to Hewlett Packard Enterprise Development LP (Spring, Texas).

"Testing transceiver ports of a network device with on-chip time domain reflectometry diagnostic tests" was invented by Abhiram Balasubramanian (Foster City, Calif.), Joyce Kitabayashi (Cupertino, Calif.), Junchun Liang (Santa Clara, Calif.), Peter C. Nguyen (San Jose, Calif.), Robin Philip (Cupertino, Calif.) and Shaghayegh Azgomi (Los Altos, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A network device may identify an integrated circuit, a port group number, port lanes, and port channels associated with a transceiver port of a network devi...