US Patent Issued to HERMES TESTING SOLUTIONS on April 21 for "Probe card monitoring system and monitoring method thereof" (Taiwanese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,651, issued on April 21, was assigned to HERMES TESTING SOLUTIONS INC. (Hsinchu City, Taiwan).

"Probe card monitoring system and monitoring method thereof" was invented by Wei-Ting Chen (Hsinchu City, Taiwan) and Shih-Ying Chou (Hsinchu City, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A probe card monitoring system is adapted for any one of a probe card including a reinforcement frame and a printed circuit board or a prober including a head plate and a clamping mechanism, and includes at least one sensor and a control unit. The at least one sensor is disposed in one of the probe card and the prober to measure a distance between the probe...