US Patent Issued to Here Global on Aug. 11 for "Method, apparatus, and system of providing zone-to-zone trip reliability analysis using probe data" (Illinois Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,386, issued on Aug. 11, was assigned to Here Global B.V. (Eindhoven, Netherlands).

"Method, apparatus, and system of providing zone-to-zone trip reliability analysis using probe data" was invented by Jingwei Xu (Buffalo Grove, Ill.), Weimin Huang (Chicago), Yuxin Guan (Chicago) and Bruce Bernhardt (Wauconda, Ill.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An approach is provided for zone-to-zone trip reliability. The approach involves, for example, determining probe data collected from a plurality of sensors of a plurality of probe vehicles traveling in a geographic area of interest. The approach also involves processing the probe data to determ...