US Patent Issued to Hefei Heshi Keda Intelligent Technology on April 21 for "System and method for synchronously detecting thickness and double-side surface profiles" (Chinese Inventor)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,453, issued on April 21, was assigned to Hefei Heshi Keda Intelligent Technology Co. Ltd. (Hefei, China).

"System and method for synchronously detecting thickness and double-side surface profiles" was invented by Huajun Liu (Hefei, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system and a method for synchronously detecting thickness and double-side surface profiles that belongs to the technical field of optical measurement. The system includes a light source system, a deflection reflection system, a camera acquisition system, and a processing system. The deflection reflection system includes a decomposition unit and an integration unit. I...