US Patent Issued to Hangzhou Dianzi University on April 7 for "Fabric defect detection method" (Chinese Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,113, issued on April 7, was assigned to Hangzhou Dianzi University (Hangzhou City, China).

"Fabric defect detection method" was invented by Lingjun Zhang (Hangzhou City, China), Hua Zhang (Hangzhou City, China), Yifan Wu (Hangzhou City, China) and Yifei Wu (Hangzhou City, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides a fabric defect detection method, including the following steps: constructing a data set; preprocessing the data set; constructing a region-based convolutional neural network (R-CNN) model for fabric defect detection; where the R-CNN model for fabric defect detection includes four convolutional lay...