US Patent Issued to Hangzhou Alltest Biotech on Sept. 22 for "Test strip" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 24 -- United States Patent no. D1,149,098, issued on Sept. 22, was assigned to Hangzhou Alltest Biotech Co. Ltd (Hangzhou, China).

"Test strip" was invented by Yinfei Wu (Hangzhou, China), Haipeng Hu (Hangzhou, China) and Weike Lu (Hangzhou, China).

The patent was filed on Sept. 19, 2025, under Application No. D/023,971.

*For further information, including images, charts and tables, please visit: http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO2&Sect2=HITOFF&p=1&u=%2Fnetahtml%2FPTO%2Fsearch-bool.html&r=1&f=G&l=50&co1=AND&d=PTXT&s1=D1149098&OS=D1149098&RS=D1149098

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