US Patent Issued to Hangzhou Alltest Biotech on July 21 for "All-in-one test device" (Chinese Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. D1,136,260, issued on July 21, was assigned to Hangzhou Alltest Biotech Co. Ltd (Hangzhou, China).

"All-in-one test device" was invented by Shiwei Rao (Hangzhou, China), Yinfei Wu (Hangzhou, China), Haipeng Hu (Hangzhou, China), Yanli Wu (Hangzhou, China) and Haijian Wang (Hangzhou, China).

The patent was filed on May 27, 2025, under Application No. D/005,584.

*For further information, including images, charts and tables, please visit: http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO2&Sect2=HITOFF&p=1&u=%2Fnetahtml%2FPTO%2Fsearch-bool.html&r=1&f=G&l=50&co1=AND&d=PTXT&s1=D1136260&OS=D1136260&RS=D1136260

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