US Patent Issued to HANA TECHNOLOGY on May 19 for "Leak inspection apparatus and method for secondary battery cell" (South Korean Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,515, issued on May 19, was assigned to HANA TECHNOLOGY Co. LTD. (Yongin-si, South Korea).

"Leak inspection apparatus and method for secondary battery cell" was invented by Tae Bong Oh (Suwon-si, South Korea), Souk Woo Lee (Hwaseong-si, South Korea), Jung Ho Song (Suwon-si, South Korea), Seung A Han (Seoul, South Korea) and Sang Rae Kim (Yongin-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A leak inspection apparatus for secondary battery cells and a leak inspection method for secondary battery cells are to determine whether leakage occurs in a secondary battery cell being inspected by creating a pressure difference between the inside...