US Patent Issued to HAMAMATSU PHOTONICS on Sept. 1 for "Optical measurement device and optical measurement method" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,975, issued on Sept. 1, was assigned to HAMAMATSU PHOTONICS K.K. (Hamamatsu, Japan).

"Optical measurement device and optical measurement method" was invented by Fusanori Kondo (Hamamatsu, Japan), Naoki Iwata (Hamamatsu, Japan), Tomokazu Matsumura (Hamamatsu, Japan) and Teruo Takeshita (Hamamatsu, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "In an optical measurement device, in a first process, a reference member is irradiated with excitation light, light for a calibration process including scattered light associated with the excitation light from a reference member is detected as detection light, a calibration signal corresponding to the lig...