US Patent Issued to HAMAMATSU PHOTONICS on May 12 for "Time measurement device, fluorescence lifetime measurement device, and time measurement method" (Japanese Inventor)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,074, issued on May 12, was assigned to HAMAMATSU PHOTONICS K.K. (Hamamatsu, Japan).

"Time measurement device, fluorescence lifetime measurement device, and time measurement method" was invented by Fuminori Niikura (Hamamatsu, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A time measurement apparatus 10 includes a TAC circuit 12, a measurement gate 11, a control unit 14 for setting a gate dead time, which is a time during which the measurement gate 11 is set to be in the second state, in the measurement gate 11, and the control unit 14 for deriving and outputting time information related to the detection signal based on a measurement signal out...